ISL85009EVAL1Z開發(fā)板套件編程器的評估板-DC/DC與AC/DC（離線）SMPS規(guī)格書PDF中文資料

The ISL85009 is a highly efficient, monolithic, synchronous

buck regulator that can deliver 9A of continuous output current

from a 3.8V to 18V input supply. The device uses current mode

control architecture with a fast transient response and

excellent loop stability.

The ISL85009 integrates very low ON-resistance high-side and

low-side FETs to maximize efficiency and minimize external

component count. The minimum BOM and easy layout

footprint are extremely friendly to space constraint systems.

The operation frequency of this device can be set using the

FREQ pin: 600kHz (FREQ = float) and 300kHz (FREQ = GND).

The device can also be synchronized to an external clock up to

1MHz.

Both high-side and low-side MOSFET current limit along with

reverse current limit, fully protect the regulator in an

overcurrent event. Selectable OCP schemes can fit various

applications. Other protections, such as input/output

overvoltage and over-temperature, are also integrated into the

device which give required system level safety in the event of

fault conditions.

The ISL85009 is offered in a space saving 15 Ld 3.5mmx3.5mm

Pb-free TQFN package with great thermal performance and

0.8mm maximum height.

Features

? Power input voltage range variable 3.8V to 18V

? PWM output voltage adjustable from 0.6V

? Up to 9A output load

? Prebias start-up, fixed 3ms soft-start

? Selectable fSW of 300kHz, 600kHz, and external

synchronization up to 1MHz

? Peak current mode control

- DCM/CCM

- Thermally compensated current limit

- Internal/external compensation

? Open-drain PG window comparator

? Output overvoltage and thermal protection

? Input overvoltage protection

? Integrated boot diode with undervoltage detection

? Selectable OCP schemes

- Hiccup OCP

- Latch-off

? Compact size 3.5mmx3.5mm, 15 Ld TQFN

Applications

? Servers and cloud infrastructure POLs

? IPCs, factory automation, PLCs

? Telecom and networking systems

? Storage systems

? Test measurement