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TPS7H2211HKR/EM

Marking：TPS7H2211HKR；Package：CFP；TPS7H2211-SP Radiation-Hardness-Assured (RHA) 14-V, 3.5-A eFuse

1Features ?Totalionizingdose(TID)characterizedto100 krad(Si) –Radiationhardnessassuranceavailabilityof 100krad(Si) ?Single-eventeffects(SEE)characterized –Single-eventlatchup(SEL),single-event burnout(SEB),andsingle-eventgaterupture (SEGR)immunetolinearenergy

TITexas Instruments

德州儀器美國德州儀器公司

TPS7H2211HKR/EM

Marking：TPS7H2211HKR/EM；Package：CFP；TPS7H2211-SP and TPS7H2211-SEP Radiation-Hardness-Assured (RHA) 14-V, 3.5-A eFuse

1Features ?Totalionizingdose(TID)characterizedto100 krad(Si) –Radiationhardnessassuranceavailabilityof 100krad(Si) ?Single-eventeffects(SEE)characterized –Single-eventlatchup(SEL),single-event burnout(SEB),andsingle-eventgaterupture (SEGR)immunetolinearenergy

TI1Texas Instruments

德州儀器美國德州儀器公司

TPS7H2211HKR/EM

Marking：TPS7H2211HKR/EM；Package：CFP；TPS7H2211-SP and TPS7H2211-SEP Radiation-Hardness-Assured (RHA) 14V, 3.5A eFuse

1Features ?Totalionizingdose(TID)characterizedto 100krad(Si) –Radiationhardnessassuranceavailabilityof 100krad(Si) ?Single-eventeffects(SEE)characterized –Single-eventlatchup(SEL),single-event burnout(SEB),andsingle-eventgaterupture (SEGR)immunetolinearenergyt

TI1Texas Instruments

德州儀器美國德州儀器公司

TPS7H2211HKR/EM

Marking：TPS7H2211HKR/EM；Package：CFP；TPS7H2211-SP Radiation-Hardness-Assured (RHA) 14-V, 3.5-A eFuse

TITexas Instruments

德州儀器美國德州儀器公司

TPS7H2211HKRSLASHEM

TPS7H2211-SPandTPS7H2211-SEPRadiation-Hardness-Assured(RHA)14V,3.5AeFuse

1Features ?Totalionizingdose(TID)characterizedto 100krad(Si) –Radiationhardnessassuranceavailabilityof 100krad(Si) ?Single-eventeffects(SEE)characterized –Single-eventlatchup(SEL),single-event burnout(SEB),andsingle-eventgaterupture (SEGR)immunetolinearenergyt

TI1Texas Instruments

德州儀器美國德州儀器公司

TPS7H2211HKRSLASHEM

TPS7H2211-SPandTPS7H2211-SEPRadiation-Hardness-Assured(RHA)14-V,3.5-AeFuse

1Features ?Totalionizingdose(TID)characterizedto100 krad(Si) –Radiationhardnessassuranceavailabilityof 100krad(Si) ?Single-eventeffects(SEE)characterized –Single-eventlatchup(SEL),single-event burnout(SEB),andsingle-eventgaterupture (SEGR)immunetolinearenergy

TI1Texas Instruments

德州儀器美國德州儀器公司

TPS7H2211HKRSLASHEM

TPS7H2211-SPRadiation-Hardness-Assured(RHA)14-V,3.5-AeFuse

TITexas Instruments

德州儀器美國德州儀器公司

TPS7H2211HKRSLASHEM

TPS7H2211-SPRadiation-Hardness-Assured(RHA)14-V,3.5-AeFuse

1Features ?Totalionizingdose(TID)characterizedto100 krad(Si) –Radiationhardnessassuranceavailabilityof 100krad(Si) ?Single-eventeffects(SEE)characterized –Single-eventlatchup(SEL),single-event burnout(SEB),andsingle-eventgaterupture (SEGR)immunetolinearenergy

TITexas Instruments

德州儀器美國德州儀器公司

TPS7H2211HKRSLASHEM

TPS7H2211-SPandTPS7H2211-SEPRadiation-Hardness-Assured(RHA)14V,3.5AeFuse

1Features ?Totalionizingdose(TID)characterizedto 100krad(Si) –Radiationhardnessassuranceavailabilityof 100krad(Si) ?Single-eventeffects(SEE)characterized –Single-eventlatchup(SEL),single-event burnout(SEB),andsingle-eventgaterupture (SEGR)immunetolinearenergyt

TI2Texas Instruments

德州儀器美國德州儀器公司

TPS7H2211MDAPTSEP

TPS7H2211-SPandTPS7H2211-SEPRadiation-Hardness-Assured(RHA)14V,3.5AeFuse

1Features ?Totalionizingdose(TID)characterizedto 100krad(Si) –Radiationhardnessassuranceavailabilityof 100krad(Si) ?Single-eventeffects(SEE)characterized –Single-eventlatchup(SEL),single-event burnout(SEB),andsingle-eventgaterupture (SEGR)immunetolinearenergyt

TI1Texas Instruments

德州儀器美國德州儀器公司

供應(yīng)商型號(hào)品牌批號(hào)封裝庫存備注價(jià)格
TI
25+
CFP (HKR)
6000
原廠原裝,價(jià)格優(yōu)勢(shì)
 詢價(jià)
TI
23+
CFP-16
5000
全新原裝正品現(xiàn)貨
 詢價(jià)
TI
25+
原封裝
66330
鄭重承諾只做原裝進(jìn)口現(xiàn)貨
 詢價(jià)
Texas Instruments
23+/24+
32-TSSOP
8600
只供原裝進(jìn)口公司現(xiàn)貨+可訂貨
 詢價(jià)
TI
24+
32-TSSOP
7681
主營TI原裝正品,歡迎選購
 詢價(jià)
TI/德州儀器
25+
原廠封裝
10280
原廠授權(quán)代理,專注軍工、汽車、醫(yī)療、工業(yè)、新能源！
 詢價(jià)
TI德州儀器
22+
24000
原裝正品現(xiàn)貨,實(shí)單可談,量大價(jià)優(yōu)
 詢價(jià)
TI(德州儀器)
2024+
N/A
500000
誠信服務(wù),絕對(duì)原裝原盤
 詢價(jià)
TI
22+
NA
500000
萬三科技,秉承原裝,購芯無憂
 詢價(jià)
TI
16+
原廠封裝
29
宇航IC只做原裝假一罰十
 詢價(jià)
更多TPS7H2211HKR/EM供應(yīng)商 更新時(shí)間2025-5-23 11:31:00

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